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Download the Paper (182 K, PDF file) - January 30, 2007 Tell a colleague about it. Printing Tips: Select 'print as image' in the Acrobat print dialog if you have trouble printing.

ABSTRACT:
A new diagnostic method for point processes is here presented. It is based on their second-order analysis, transforming the original point process by the inverse of its conditional intensity function in order to form a generalized estimate of various second-order point process properties. The result is generalized versions of the spectral density, R/S statistic, correlation integral and K-function, which can be used to test the fit of complex point process models with arbitrary conditional intensity model, rather than a stationary Poisson model.

SUGGESTED CITATION:
Giada Adelfio and Frederic P. Schoenberg, "Introduction to a diagnostic approach for point processes based on weighted second-order statistics" (January 30, 2007). Department of Statistics, UCLA. Department of Statistics Papers. Paper 2007010115.
http://repositories.cdlib.org/uclastat/papers/2007010115