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James-Stein Type Estimator in Large Samples with Application to the Least Absolute Deviations Estimator
Tae-Hwan Kim, Yonsei University
Halbert White, University of California, San Diego
ABSTRACT: We explore the extension of James-Stein type estimators in a direction that enables them to
preserve their superiority when the sample size goes to infinity. Instead of shrinking a base estimator
towards a fixed point, we shrink it towards a data-dependent point. We provide an analytic expression for
the asymptotic risk and bias of James-Stein type estimators shrunk towards a data-dependent point and
prove that they have smaller asymptotic risk than the base estimator. Shrinking an estimator toward a datadependent
point turns out to be equivalent to combining two random variables using the James-Stein rule.
We propose a general combination scheme which includes random combination (the James-Stein
combination) and the usual nonrandom combination as special cases. As an example, we apply our method
to combine the Least Absolute Deviations estimator and the Least Squares estimator. Our simulation study
indicates that the resulting combination estimators have desirable finite sample properties when errors are
drawn from symmetric distributions. Finally, using stock return data we present some empirical evidence
that the combination estimators have the potential to improve out-of-sample prediction in terms of both
mean square error and mean absolute error.
SUGGESTED CITATION: Tae-Hwan Kim and Halbert White,
"James-Stein Type Estimator in Large Samples with Application to the Least Absolute Deviations Estimator"
(May 1, 2000).
Department of Economics, UCSD.
Paper 99-04R.
http://repositories.cdlib.org/ucsdecon/99-04R
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